dtip
Barcelona, Spain
16-18 April 2013
SYMPOSIUM on

Design, Test, Integration
& Packaging of MEMS/MOEMS
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Special sessions




Special Session on Reliability Criteria in MEMS/NEMS Design, Manufacturing and Test

MEMS/NEMS production needs interdisciplinary skills, especially concerning the integration of micro- and nano-technologies. For this reason, novel reliability criteria have to be defined for obtaining aging and failure of manufactured devices, and new protocols are needed with respect to well established procedures known in microelectronics.

This special session is organized by Romolo MARCELLI from CNR-IMM Roma, Italy.

Special Session on In-Vitro Diagnostic Devices

In-Vitro Diagnostics (IVD) plays an essential and valuable role in the global healthcare industry. Recent advancements in micro/nano technologies have benefited the development of IVD devices that are low cost, sensitive, specific, easy to use, rapid and robust, and disposable, as well as consuming only a small sample. This special session focuses on the implementation of micro/nano technologies in the conception, design, fabrication and analysis of IVD devices.

This special session is co-organized by Gou-Jen WANG, National ChungHsing Univ., Taiwan and by Erik JUNG, FhG IZM, Berlin, Germany

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