CAD, Design and Test Conference

Aim of the Conference

This Conference will bring together researchers, engineers and practitioners involved in the development of CAD tools and design methodologies for MEMS and MOEMS. The participants will also have the opportunity to interact with the other Conference by the means of plenary invited talks.

Conference Chair: T. MUKHERJEE, Carnegie Mellon University, Pittsburgh, USA

Conference Co-Chair: J.M. KARAM, MEMScAP, Grenoble, France

Programme Committee

S. BLANTON, Carnegie Mellon Univ., Pittsburgh, USA
M. RENCZ, BUTE, Budapest, Hungary
Y.C. LIANG, National University of Singapore
R. RUDD, Lawrence Livermore National Lab., Livermore, USA
R. LAUR, University Bremen, Germany
G. WACHUTKA, TU Mčnchen, Germany
M. ISMAIL, Ohio State University, Columbus, USA
Z. CUI, RAL, United Kingdom
S. LEVITAN, University of Pittsburgh, USA
C. CANE, University of Barcelona, Spain
J. KORVINK, University of Freiburg, Germany
I. BALK, IntelliSense Corp., Wilmington, USA
B. VIGNA, STMicroelectronics, Cornadero, Italy
M.A. MAHER, MEMScAP Inc., Raleigh, USA
F. MALOBERTI, University of Texas at Dallas, USA
T. VEIJOLA, Helsinki University of Technology, Finland
C. DUFAZA, University de Provence, Marseille, France
J. Van KUIJK, Coventor, Cambridge, USA
A. KAISER, IEMN, Lille, France

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